Computer implemented system and method of translation of verification commands of an electronic design

ABSTRACT

A computer implemented method of translation of verification commands of an electronic design, comprises the steps of receiving the electronic design, receiving at least one analog test harness model having at least one indirect branch contribution statement and having at least two stimulus parameter stored in at least one specification database and at least one measurement parameter stored in at least one specification database and at least one specification parameter stored in at least one specification database, a first stimulus parameter of the at least two stimulus parameters comprising an input to an input pin of the electronic circuit defined by the electronic design file, translating the at least one indirect branch contribution statement into a plurality of direct branch contribution operators based at least in part upon the at least one analog test harness model and at least one of at least two stimulus parameter stored in at least one specification database and at least one measurement parameter stored in at least one specification database and at least one specification parameter stored in at least one specification database and generating a netlist based at least in part upon the translation.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. Continuation-In-Partapplication Ser. No. 15/654,469, filed Jul. 19, 2017, entitled COMPUTERIMPLEMENTED SYSTEM AND METHOD OF TRANSLATION OF VERIFICATION COMMANDS OFAN ELECTRONIC DESIGN, which is a Continuation-in-Part of U.S. patentapplication Ser. No. 14/707,689, filed on May 8, 2015, entitled COMPUTERIMPLEMENTED SYSTEM AND METHOD OF TRANSLATION OF VERIFICATION COMMANDS OFAN ELECTRONIC DESIGN, which issued as U.S. Pat. No. 9,715,566 on Jul.25, 2017. U.S. patent application Ser. No. 14/707,689 claims benefit ofU.S. Provisional App. No. 61/991,072, filed on May 9, 2014, entitledCOMPUTER IMPLEMENTED SYSTEM AND METHOD OF TRANSLATION OF VERIFICATIONCOMMANDS OF AN ELECTRONIC DESIGN. U.S. application Ser. Nos. 15/654,469,14/707,689 and 61/991,072, and U.S. Pat. No. 9,715,566 are incorporatedby reference herein in their entirety.

BACKGROUND

The method and system are generally related to the verification ofanalog and mixed signal integrated circuits and more specifically to asystem and method to translate verification subroutine commands.

Electronic design automation (EDA) is software for designing electronicblocks. There are several broad types of electronic signals, componentsand blocks: digital, analog and a mixture of digital and analog termedmixed signal. The electronic design generally comprises at least one ofthe following levels of circuit information: a system level, anarchitectural level, a dataflow level, an electrical level, a devicelevel and a technology level and the like.

Digital signals have discrete input and output values “0” and “1”,occurring at discrete time values, typically tied to a clock signal.Digital components which input and output the digital signals typicallyhave static pin outs and interaction protocols. Digital blocks comprisedof the digital components have well established and well documentedphysical layouts and electrical interactions. Simulators for digitalblocks are discrete time event driven simulators.

Analog signals generally have continuous input and output values thatmay vary over time. Analog components typically have customizablelayouts in order to modify inputs, outputs, triggers, biases, etc.Therefore, due to customization, analog blocks comprised of the analogcomponents may not have as well established or well documented physicallayouts or electrical interactions as digital circuits. Simulators foranalog blocks generally necessitate continuous time domain simulators.

Mixed signal blocks are a combination of digital signal blocks andanalog signal blocks within a component being simulated. The most commonoptions available for simulation are to simulate the component as agrouping of analog blocks, or to separately analyze the analogcomponents/blocks and the digital components/blocks and translate theinputs and outputs at the boundaries of the digital and analog domainsfor inter-domain communication.

Within EDA there are two broad categories of circuit review that arerelated: simulation and verification. Simulation is a numerical solutionset that predicts the behavior of a circuit. Verification is thesystematic pursuit of describing the behavior of a circuit underrelevant conditions (functional verification) and over manufacturingprocess variation (parametric verification). Therefore, verificationgenerally necessitates a much more extensive review of the circuit, itsoperating conditions, and manufacturing operation variations than asimulation. It is possible to run a large number of simulations withoutverifying to any significant degree the functionality of a circuit.Verification is the mathematical modeling of circuit behavior andevaluation of circuit performance over a range of conditions.Ultimately, the measure of success of verification is to report how wellthe circuit design complies with the circuit specification. Analog andmixed signal verification methodology is struggling to keep pace withthe complexity, cost, and computational demands of ever-growing analogand mixed signal circuits.

The number and complexity of verification test cases grows with thecomplexity of analog and mixed signal designs. Additionally, simulationspeed decreases and memory utilization increases as the size of thecircuit grows. Thus, the computational processing-power to verify acircuit may dramatically increase with circuit complexity. To make thisissue more painful, verification normally occurs at the end of thedesign cycle where schedule delays are perceived to be most severe.Thus, verification is an activity that generally necessitates asignificant amount of simulation processing-power for a small part ofthe overall design cycle, and therefore an efficient use of verificationresources is generally necessitated to meet time to market demands.

Today's complex verification solutions specifically focus engineering onthe verification activity to ensure that the operation of the circuit isfully and efficiently verified under pertinent conditions. This focusedanalog and mixed signal verification is much more manual and experiencedriven than digital verification. This sporadic interactive analogverification leaves companies at risk. The present disclosure may allowverification tasks to be defined at a higher level of abstraction. Thepresent disclosure may allow efficient capture of complex relationshipsbetween stimulus or stimulus assertions and output measurements oroutput assertions. The present disclosure may allow the test oftransistor level circuits, circuits implemented with behavioral models,or circuits that contain a combination of behavioral models andtransistor level implementations. Standard branch contributionstatements cannot be used in conditional, looping, nomenclature oranalysis based statements, unless the conditional expression is aconstant expression. For purposes of differentiation, we are callingthese standard branch contribution statements as direct branchcontribution statements. In this disclosure an indirect branchcontribution statement (IBCS) is more powerful than a direct branchcontribution statement (DBCS). Specifically, indirect branchcontribution statements can be used in conditional and loopingconstructs that are dynamic with respect to the user's design, designconfiguration, simulation/analysis configuration, verification state,and verification history. There is a long felt need for independentbranch contribution statements to be used in conditional, looping,nomenclature or analysis based statements or to return differentarguments resulting from ongoing analysis.

In addition, the increasing complexity of the designs requires moretraceability back to the product specification. Today many customers andindustry require documentation of specific verification tests thatvalidate each specification and test condition. The present disclosureincludes the concept of high-level indirect branch contributionstatements that can include parameters that link back to a specificationdatabase. These parameters can include but are not limited tospecification limits, test stimulus conditions (for example, a supplyvoltage), and measurement requirements (for example, a net crossing acertain value). In this disclosure, at the time of the translation ofthe verification commands, the specification database can be accessedand the parameters replaced with the exact corresponding values from thespecification database. The other option is to leave the linkedparameters in the netlist and access the specification database toextract the parameter values at the time of simulation.

Robust verification of analog and mixed signal circuits generallynecessitates a significant investment in test benches, performanceanalysis routines, and macro-models that may be used to accelerate thesimulations. The complexity of this collateral grows with the complexityof the analog and mixed signal integrated circuits to be verified. As adesign team adds design resources it also needs to add verificationresources, adding to the cost of the design. The efficient use of thoseresources becomes paramount due to the inevitable time constraints thatare imposed at the end of the design cycle, when companies are trying toget a product to market.

The current technology trajectory, within the electronics manufacturingindustry, is to move more and more toward single chip designs, calledSystems on a Chip (SoC), or multi-chip modules (MCM) where multiplechips are included in one package. Most systems on a chip and multi-chipmodules generally necessitate some level of mixed signal verification.As mixed signal designs continue to increase in size and complexity,this places additional burdens on verification to insure first passdesign success and reduce the time-to-market. Although the complexity ofanalog and mixed signal ASIC design has followed Moore's law,innovations in design verification generally have not.

Valuable design time and computational resources as well as expensivesimulator resources may be specifically focused by the disclosed methodfor translating verification subroutine commands. The method makes thecapture of complex stimulus as well as capture of output assertions andmeasurements more efficient. The resulting intelligent test benchesidentify areas that fail verification and, by greatly reducing the needfor manual interpretation of results, provide much more immediatefeedback to the design team and design management. Improving the testefficiency (i.e., not wasting simulation time and reducing time foroutput analysis) allows more efficient use of resources. In addition byconnecting critical parameters to a specification database, thetranslated commands can access the latest version of the specificationand provide traceability from the specification to the resultingverification test and outcome.

This disclosure is related to translating verification subroutinecommands during verification of an electronic design for analog andmixed signal (A/MS) application specific integrated circuits (ASICs) andlinking critical parameters back to a specification database. Analog andmixed signal integrated circuits exist in many modern electronicdevices, and these circuits needs to be verified through simulationprior to fabrication.

SUMMARY

The present invention, as disclosed and described herein, in one aspectthereof comprise a computer implemented method of translation ofverification commands of an electronic design, comprises the steps ofreceiving the electronic design, receiving at least one analog testharness model having at least one indirect branch contribution statementand having at least two stimulus parameter stored in at least onespecification database and at least one measurement parameter stored inat least one specification database and at least one specificationparameter stored in at least one specification database, a firststimulus parameter of the at least two stimulus parameters comprising aninput to an input pin of the electronic circuit defined by theelectronic design file, translating the at least one indirect branchcontribution statement into a plurality of direct branch contributionoperators based at least in part upon the at least one analog testharness model and at least one of at least two stimulus parameter storedin at least one specification database and at least one measurementparameter stored in at least one specification database and at least onespecification parameter stored in at least one specification databaseand generating a netlist based at least in part upon the translation.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure will be more clearly understood fromconsideration of the following detailed description and drawings inwhich:

FIG. 1 is a block diagram showing a computer system suitable forpracticing the instant disclosure;

FIG. 2 is a block diagram showing a computer network system suitable forpracticing the instant disclosure;

FIG. 3 depicts an example Low Voltage Dropout (LDO) circuit;

FIG. 4 depicts an example amplifier circuit;

FIG. 5 depicts a test bench pin out for an amplifier;

FIG. 6 depicts a general example hierarchy;

FIG. 7 depicts an instance parsed example test hierarchy;

FIG. 8 depicts a first example test bench for a power managementintegrated circuit;

FIG. 9 depicts a second example test bench for a power managementintegrated circuit;

FIG. 10 depicts a third example test bench for a power managementintegrated circuit;

FIG. 11 depicts an example mux and opamp having translating verificationsubroutine commands of an electronic design;

FIG. 12 depicts a B level example of translating verification subroutinecommands of an electronic design;

FIG. 13 depicts a D level example of translating verification subroutinecommands of an electronic design;

FIG. 14 depicts a hierarchical example of translating verificationsubroutine commands of an electronic design;

FIG. 15 depicts an E level example of translating verificationsubroutine commands of an electronic design;

FIG. 16 depicts a first example of translating verification subroutinecommands of an electronic design;

FIG. 17 depicts a second example of translating verification subroutinecommands of an electronic design;

FIG. 18 depicts a third example of translating verification subroutinecommands of an electronic design;

FIG. 19 depicts a fourth example of translating verification subroutinecommands of an electronic design;

FIG. 20 depicts a fifth example of translating verification subroutinecommands of an electronic design; and

FIG. 21 depicts a sixth example of translating verification subroutinecommands of an electronic design.

References in the detailed description correspond to like references inthe various drawings unless otherwise noted. Descriptive and directionalterms used in the written description such as right, left, back, top,bottom, upper, side, et cetera, refer to the drawings themselves as laidout on the paper and not to physical limitations of the disclosureunless specifically noted. The drawings are not to scale, and somefeatures of examples shown and discussed are simplified or amplified forillustrating principles and features as well as advantages of thedisclosure.

DETAILED DESCRIPTION

The features and other details of the disclosure will now be moreparticularly described with reference to the accompanying drawings, inwhich various illustrative examples of the disclosed subject matter areshown and/or described. It will be understood that particular examplesdescribed herein are shown by way of illustration and not as limitationsof the disclosure. Furthermore, the disclosed subject matter should notbe construed as limited to any of examples set forth herein. Theseexamples are provided so that this disclosure will be thorough andcomplete, and will fully convey the scope of the disclosed subjectmatter to those skilled in the art. The principle features of thisdisclosure may be employed in various examples without departing fromthe scope of the disclosure.

The terminology used herein is for the purpose of describing particularexamples only and is not intended to be limiting of the disclosedsubject matter. Like number refer to like elements throughout. As usedherein the term “and/or” includes any and all combinations of one ormore of the associated listed items. Also, as used herein, the singularforms “a”, “an”, and “the” are intended to include the plural forms aswell, unless the context clearly indicates otherwise. It will be furtherunderstood that the terms “comprises”, and/or “comprising” when used inthis specification, specify the presence of stated features, integers,steps, operations, elements, and/or components, but do not preclude thepresence or addition of one or more other features, integers, steps,operations, elements, components, and/or groups thereof. Also, as usedherein, relational terms such as first and second, top and bottom, leftand right, and the like may be used solely to distinguish one entity oraction from another entity or action without necessarily requiring orimplying any actual such relationship or order between such entities oractions.

Cost of entry barriers into analog and mixed signal IC design is endemicespecially to fabless companies that are developing ASIC intellectualproperty in the form of packaged ASICs or modules to be integrated intotheir customer's Systems-on-Chip (SoCs) or multi-chip modules (MCMs).For example, if a fabless design center is staffed with five IC designengineers, equipping the team with design tools is financiallyequivalent to quadrupling the staff. This is due to the high cost ofownership of the EDA tools, not just in annual license fees,installation and support, training and the like. Reducing system usethrough translation of verification commands allows more efficientresource allocation.

Analog and mixed signal verification is time and computer intensive.Functionality of the circuit for various inputs, at various conditionsand for various manufacturing conditions are generally necessitated tobe simulated to insure that the circuit functions to the specifications.

Branch contribution statements are utilized to describe behavior incontinuous time between analog nets and ports. The direct contributionstatement utilizes a branch contribution operator, <+, to describe amathematical relationship between one or more analog nets. These directcontribution statements utilize arguments that are a constantexpression. Standard branch contribution statements cannot be used inconditional, looping, nomenclature or analysis based statements, unlessthe conditional expression is a constant expression. For purposes ofdifferentiation, we are calling these standard branch contributionstatements as direct branch contribution statements. In this disclosurean indirect branch contribution statement (IBCS) is more powerful than adirect branch contribution statement (DBCS). Specifically, indirectbranch contribution statements can be used in conditional and loopingconstructs that are dynamic with respect to the user's design, designconfiguration, simulation/analysis configuration, verification state,and verification history. Indirect branch contribution statements allowdynamic code that generates direct branch contribution statements basedon the content of the netlist.

AMSTTM (Analog Mixed Signal Test) is a module for specifyinganalog/mixed-signal (A/MS) stimulus as well as assertions and outputmeasurements. An AMST is able to efficiently capture complexrelationships between stimulus and output assertions. Verificationmodels specified in the AMST Language (AMSTLTM) captures higher levelcommands that are subsequently translated into Verilog-A/AMS. Verilog-A,Verilog-AMS, VHDL-AMS, SystemC-AMS or the like, which are standardizedlanguages for defining analog and mixed-signal, respectively. It isenvisioned that the code could also be used to generate any languagestandard that supports direct branch contribution statements for analogsimulators.

AMSTL can be used to capture higher level commands with IBCS regardlessof whether the resulting translated code will be used in the behavioralmodel of a circuit or a test harness. The value of capturing assertionswithin an AMST rather than in the behavioral model of the circuit isthat the verification commands can be reused regardless of therepresentation of the circuit. For example, in FIG. 15 the AMP_AMSTblock will execute the same commands and assertions whether the op ampand mux are represented as transistor level schematics or behavioralmodels. The AMP_AMST now serves as verification intellectual property(VIP) that can be reused with these circuits. This concept becomesespecially valuable when considering the case of providing analog designintellectual property (IP) to a third party. The purchasing party nowhas verification IP that can be embedded with the purchased IP within alarger SOC. This VIP reduces the risk that the purchased design IP willbe used incorrectly. Verification IP has been a proven concept fordigital circuits and top-level inputs and outputs but has not beenpreviously practical to provide with embedded analog IP.

The language AMSTL is intended to describe behaviors, stimulus, outputs,measurements, etc. for analog mixed signal integrated circuit design andprovides higher level constructs than available in standard hardwaredescription languages that are intended for input into analogsimulators. One benefit is an efficiency improvement based on theavailability of IBCS in AMSTL. Additionally, AMSTL code can be parsed tooutput any desired standard language. The module AMST is a behavioralmodel of analog mixed-signal verification intellectual property and isintended to reside at any level of the hierarchy within the design. Themodule may reside with the IP that it is monitoring, stimulating and/orevaluating. The output form of the model (in Verilog-A, Verilog-AMS,VHDL-AMS, etc.) can be input through a netlist into an analog ormixed-signal simulator.

The AMST can include parameters that link to a specification database.The specification database includes at least one of the following typesof information: specification limits, measurement conditions, orstimulus conditions. A specification limit is the value(s) thatdescribes the limits of the allowed performance for a certain test. Forinstance, a specification for a SOC may include a specification calledsupply current. The supply current may include a minimum, typical,and/or maximum limit value. For instance, the supply current shouldnever drop below the minimum limit during the test or measurementconditions specified and should never exceed the maximum limitspecified. The “typical” value is provided as information on how thepart performs under normal conditions that are most often defined asperformance at room temperature. Strictly speaking, the “typical” valueis not a limit of operation. “Measurement condition” is a term that canbe used to broadly describe any test condition including stimulus, butfor this discussion, measurement condition is used to describeconditions that define when a measurement can be made. For instance, ameasurement condition may state that the supply current should bemeasured only when voltage regulator output on the chip exceeds acertain value. A stimulus condition describes a stimulus such as avoltage, current, temperature, etc. that is applied to the chip or to aspecific pin on the chip. For instance, the supply current measurementmay also be defined as when the supply voltage is equal to a specificvoltage. In this example, the supply voltage is a stimulus. The goal isfor the verification automation to capture the measurement and stimulusrequirements for a given measurement as well as monitoring or measuringthe parameter being specified so that the suite of verificationsimulations can indicate that the specification limits have been met.

These parameters linked to the specification database have uniqueidentifiers. These identifiers provide the opportunity for conclusivetraceability regarding the verification activity versus thespecification. Typical implementations today for analog verificationinvolve the engineer stating (such as through a graphical interface)that a specific verification test is testing a given specification. Forinstance a verification test and an output measurement name may beassociated with a certain specification, but if the specification ischanged, there is no mechanism that can automatically update theverification test to match. Nor is there a linkage that allows automatictracking of changes versus time when the verification test is run. Inother words, without the linkage between the specification database andthe verification test, the opportunity to automatically determinewhether a verification test happened before or after a specificationchanged is lacking. Also, manual discrepancies can occur where values inthe specification and the verification test do not match. The approachdescribed within this disclosure allows critical parameters relating toa specification to be maintained within the specification database, thehigh-level verification tests to include uniquely identified parametersfrom that database, and the values for the parameters to be instantiatedeither at the time of the translation from the high-level AMSTL formatto a lower level implementations such as Verilog-AMS or at the time ofthe simulation through a parameter file created by accessing thespecification database. By definition, the parameters used duringverification will match the parameters within the specificationdatabase.

A netlist is a representation of one or more databases that containinformation relevant to a verification project and simulation taskincluding but not limited to:

-   -   1) a description of components (e.g. transistors, resistors,        capacitors, behavioral model, AMSTs, digital gates) and        properties of components that make up the design (e.g. PMOS2 has        W=1 um),    -   2) the connectivity of the design (e.g. drain of PMOS1 is        connection to gate of NMOS2),    -   3) hierarchical configuration of the design for a specific        simulation task (e.g. PLL1 is represented as a model, LDO3 is        represented at the transistor level)    -   4) configuration of the simulation task including simulation        type (e.g. transient simulation), duration (e.g. 2 ms),        tolerance settings (e.g. iabstol<10e-10), configuration of        interface elements between digital and analog partitions, and        output signal selections    -   5) any information in the verification database such as expected        performance values, signal transitions, signal shape, duty        cycle, etc of any signal or element of interest to the        verification activity).

The netlist is the input to a simulation. The purpose of a simulation isto predict the behavior of the circuit described in the netlist subjectto the stimulus conditions and accuracy criteria specified in thenetlist. Simulation is an essential part of integrated circuit (IC)design since a) photomasks for IC designs are very expense b) ICmanufacturing takes a long time, c) probing of signals internal to a ICis extremely difficult and d) bread-boarding of modern IC designs isimpractical. A simulation is performed with a simulator. At a highlevel, there are three approaches to simulating an integrated circuit:SPICE-level simulation, digital-level simulation, and mixed-modesimulation. A SPICE-level simulator reduces the netlist to a set ofnonlinear differential algebraic equations which are solved usingimplicit integration methods, Newton's method, and sparse matrixtechniques. A SPICE-level simulator conserves charge, satisfiesKirchhoff s Current Law and Kirchhoff s Voltage Law, subject to a set ofabsolute or relative tolerances. A digital simulator reduces the netlistto a set of boolean functions which are triggered by discrete events.Digital simulators do not conserve charge, satisfy Kirchhoff's CurrentLaw or Kirchhoff's Voltage Law. But they can simulate much largercircuits at a higher level of abstraction. Mixed-mode (AMS) simulationcombines a SPICE-level simulator with a digital simulator. In this typeof simulation a SPICE-level simulator is used to simulate a portion ofthe design, predicting the net voltages and terminal currents of thecomponents in the SPICE-level partition, while the digital simulator isused to predict the digital outputs of the components in the digitalpartition. In a mixed-mode simulation, the SPICE-level partition and thedigital partition are connected with interface elements which, at abasic level, are idealized 1-bit analog to digital converters (forsignals going from the SPICE partition to the digital partition) and1-bit digital to analog converters (for signals going from the digitalpartition to the SPICE partition).

A simulation can produce the following outputs:

-   -   1) continuous-time/continuous-value waveforms of net voltages        and terminal currents;    -   2) discrete-time/discrete-value digital waveforms of logic net        outputs;    -   3) any data written by any behavioral model including any AMST        modules that have been included into the netlist;    -   4) assertion violation messages;    -   5) assertion measurement values; and    -   5) debug information about model behavior, circuit convergence        difficulties, etc.

The outputs from the simulation are stored in one or more databases.These outputs are subsequently used to evaluate the suitability of thecircuit. This process can be manual. A designer can, for example, reviewwaveforms in a graphical waveform viewer. The process can also beautomated. A software program can programmatically analyze waveformresults and AMST outputs to build a spec compliance matrix whichsummarizes the set of design objectives that have been satisfied and theset of design objectives that have been failed in the circuitsimulation. Because these specification measurements can be linked tospecific specifications described for specific measurement or stimulusconditions within the specification database, the results from theverification process can be directly linked to the desiredspecifications.

Examples of what may be done with indirect branch contributionstatements (IBCS):

-   -   1. Write an indirect branch contribution statement that supports        a bus with an arbitrary number of pins (e.g. reference current        bus). As the size of the bus is changed by the designers, the        number of actual direct branch contribution statements is        dynamically reconfigured.    -   2. Write an indirect branch contribution statement that extracts        spec limits from the net names, or circuit connectivity,        allowing the implementation of supply connectivity checks.    -   3. Write an indirect branch contribution statement that sets        limits based upon previous simulation results.    -   4. Write an indirect branch contribution statement that adds        additional checks but only for the transistor-level        implementation of a block.

In each of these cases the code that makes up the indirect branchcontribution statement generates Verilog-A/AMS statements that arecompatible with the language standard.

Therefore the disclosed system and method of translation of verificationcommands may solve one or more of the following issues, to allow moreefficient use of computer and personnel resources through reducedprogramming time, to reduce the time lag to market and/or to insure amore focused and thorough verification confirmation.

Computer System of FIG. 1 illustrates the system architecture, for anexemplary computer system 100, on which the current disclosure may beimplemented. The exemplary computer system of FIG. 1 is for descriptivepurposes only. Although the description may refer to terms commonly usedin describing particular computer systems, such as a personal computer,the description and concepts equally apply to other systems, includingsystems having architectures dissimilar to FIG. 1.

Computer system 100 typically includes a central processing unit (CPU)110, which may be implemented with one or more microprocessors, a randomaccess memory (RAM) 112 for temporary storage of information, and a readonly memory (ROM) 114 for permanent storage of information. A memorycontroller 116 is provided for controlling RAM. A bus 118 interconnectsthe components of the computer system. A bus controller 120 is providedfor controlling the bus. An interrupt controller 122 is used forreceiving and processing various interrupt signals from the systemcomponents. Mass storage may be provided by flash 124, DVD 126, or harddisk 128, for example a solid-state drive. Data and software may beexchanged with the computer system via removable media such as the flashdrive and DVD. The flash drive is insertable into a Universal SerialBus, USB, drive 130, which is, in turn, connected to the bus by acontroller 132. Similarly, the DVD is insertable into DVD drive 134,which is, in turn, connected to bus by controller 136. Hard disk is partof a fixed disk drive 138, which is connected to the bus by controller140.

User input to the computer system may be provided by a number ofdevices. For example, a keyboard 142 and a mouse 144 are connected tothe bus by a controller 146. An audio transducer 148, which may act as amicrophone and a speaker, is connected to bus by audio controller 150,as illustrated. Other input devices, such as a pen and/or tablet, may beconnected to the bus and an appropriate controller and software. DMAcontroller 152 is provided for performing direct memory access to thesystem RAM.

A visual display is generated by video subsystem 154, which controlsvideo display 156. The computer system also includes a communicationsadaptor 158, which allows the system to be interconnected to a localarea network (LAN) or a wide area network (WAN) or other suitablenetwork, schematically illustrated by a bus 160 and a network 162.

Operation of the computer system is generally controlled and coordinatedby an operating system, such as the Windows and Windows 7 operatingsystems, available from Microsoft Corporation, Unix, Linux or Apple OS Xoperating system, to name a few. The operating system controlsallocation of system resources and performs tasks such as processingscheduling, memory management, networking, and I/O services, among otherthings.

Computer System FIG. 2 illustrates the system 200 in which the computeruser 210 is connected to a network 212 which in turn is connected to thecloud 214 and the compute farm 216.

An example schematic of a low voltage dropout (LDO) 300 circuit is shownin FIG. 3. The LDO has an amplifier A1, having an inverting input(−input), a non-inverting input (+input) an output, a positive voltageinput+V and a negative voltage input −V. The LDO circuit has a voltagein Vin and a voltage out Vout. The LDO has a power out block Q1, Q2 andR2. The LDO feedback circuit is comprised of R3, R4, D1 and R1. Theamplifier A1 is termed a symbol, the elements D1, R1, R2, R3, R4, C1,C2, Q1 and Q2 are referred to as primitives.

An example schematic of an amplifier A1 400 circuit is shown in FIG. 4.The symbol of the amplifier is comprised of transistors Q3, Q4, Q5, Q6,Q7 and Q8 and resistor R5. The amplifier A1, having an inverting input(−input), a non-inverting input (+input) an output, a positive voltageinput+V and a negative voltage input −V.

FIG. 5 shows a test bench 500 for amplifier A1 510. A test bench is aspecific configuration of inputs, outputs, test conditions and the likethat are run for a device to which it is connected. The test bench hasan inverting input 512, a non-inverting input 514, a positive powerinput 516, a negative power input 518 and an output 520. The test benchhas associated connections, power supplies, IOs, etc. which are referredto as the test bench collateral. The portion around the periphery of thecircuit is referred to as the verification harness. Pin outs and theoperation of the verification harness need to be matched to the circuitunder test.

FIG. 6 shows a general example hierarchy 600 of a Test bench with adevice under test, DUT. The hierarchy is arranged according to levels,A, B, C and Device and according to instances 1, 2 and 3. The connectinglines indicate which models are connected throughout the hierarchy for aspecific verification. Within level and instance, multiple view typesmay exist. The examples illustrate some possible hierarchicalconfigurations and are not intended to limit the cases and views or viewtypes.

Integrated circuit design hierarchy is the representation of integratedcircuit designs utilizing hierarchical representations. Thisrepresentation allows for more efficient creation of complex designsthat may include millions of components such as transistors, resistors,and capacitors as well as the metal lines that connect the devices. Thedesign hierarchy representation used at any given point in the designprocess may vary based on the design step being performed and the typeof design function such as analog, digital, or memory.

In the case that a design is to be manufactured, a layout of the designis created so that a representation may be mapped. This mapping allowspatterns to be created on individual levels of the mask sets to allowdesign manufacture. In general, the design flow to create the layoutrepresentation is very different for analog as compared to digitalfunctional blocks and sub systems.

Early in the design process, there may be large portions of the designthat are designed for the first time and do not have any existing layoutrepresentations. Other portions of the design may already have beenproven, and these may be represented at a higher level of abstraction orin combination may include the layout representation.

Some common types of design representations referred to here as viewsmay comprise various view types. A Schematic view type is a picture ofcomponents or blocks with connectivity shown by lines or nets andconnections to other levels of the hierarchy through pins. A Spice viewtype is a representation of a component and its associated parameters,possibly including a specific device model that will be instantiatedinto the spice netlist. An LVSExtract is a view type that is created bya tool analyzing the layout view and reverse engineering the individualcomponents and connectivity. Variations of this type of view may alsoinclude extracted parasitic components resulting from the physicallayout that were not drawn by the designer. A Layout view type is arepresentation of the specific geometries including routing for thatportion of the design. A Verilog™ view type is a text file that is instandardized Verilog™ format. A Verilog-A™ view type is a text file instandardized Verilog-A™ syntax. A Verilog-AMS™ view type is a text filein standardized Verilog-AMS™ syntax. View type names may be differentdepending on the electronic design automation tool provider, examples ofwhich include SpectreHDL and HDL-A.

Other types of view types may help organization and readability of thehierarchy. As an example, graphic design tools such as schematic capturesystems may use a Symbol view type for the graphic that is placed. Thesymbol may contain pins that connect the instance through the hierarchyas well as a drawing that indicates the function of the block. Examplesinclude common symbols for operational amplifiers, basic digital gates,transistors, resistors, and the like.

Further adding to the complexity of description, a given block at alevel of the design hierarchy may include multiple views of the sameview type. An example would be different Verilog™ representations of agiven block, for instance, one with annotated timing based on thelayout, one with estimated timing, one without timing, or differentlevels of design representation such as gate-level or register transferlevel (RTL). Similarly, an analog view may have numerous schematicviews: for instance, one that will map to the final transistor-leveldesign, one that includes placement of behavioral blocks for higherlevel modeling, one that may include parasitic elements from the layout,one that includes interface elements between analog and digital blocksfor mixed-signal simulation. Also, for analog blocks there may bemultiple Verilog-A™ or Verilog-AMS™ model views for the same block wheremodels include different functionality and accuracy based on the purposeof different simulation exercises. These multiple views and view typesare mapped into configurations that are used for a specific task oranalysis.

Often view names are created to provide hints for what types of analysisa specific view may be useful. View name may include those listedhereinafter and the like. A Schematic is a schematic view including theplacement of blocks that may be evaluated at the transistor level or atsome level of the hierarchy such as a behavioral model. ASchematic_behavioral is a schematic view that comprises behavioralelements. A Schematic_parasitics is a schematic view that includesparasitic components extracted or estimated from the layout. A Spice isa spice view that includes the information implemented in a netlist anda component for a specific analog simulator. A Behavioral_va is a textview in the Verilog-A™ format that models a specific block for an analogsimulator that may evaluate Verilog-A™, and a Behavioral_vams is a textview in the Verilog-AMS™ format that models a specific block for amixed-signal simulator that may evaluate Verilog-A™ and Verilog.

In the specific example shown in FIG. 6, general example hierarchy, withdevice under test A1, Instance 1, would be defined based on thefollowing configuration: A1, Instance 1 and B1, Instance 1 are modeledwith a Schematic level model. B2, Instance 1 is modeled with aSchematic_behavioral model, and C1, Instance 1 and C2 Instance 1 aremodeled using a Schematic model. C1, Instance 2 and C3, Instance 1 aremodeled with a Behavioral_va model. At the bottom of the hierarchy,Devices 1, 2 and 3, instances 1, 2 and 3 are modeled using Spice.

In the specific example shown in FIG. 6, Device 1, Instance 2 is a dummydevice and therefore would not change the simulator matrix. Device 1,Instance 2 is placed in the C1, Instance 1 schematic connected as adummy device and is therefore not part of the A1, Instance 1 matrix thatwould be stamped in the simulator.

Whether a change necessitates a verification to be rerun is determinedin part by the connections through the hierarchy. In this specificexample for general example hierarchy, device under test A1, Instance 1,if Device 1, Instance 2, Schematic view is changed the simulator wouldnot need to be rerun, since the device is a dummy device and would notmodify the matrix that would be stamped into the simulator.

With a view to FIG. 6, C1, Instance 1 Schematic view forms part of theconfiguration of the simulator model, and if it is changed and thechange is substantive enough to affect the simulator matrix, Test bench1 would need to be rerun. C1, Instance 2 Schematic view would not form apart of the configuration of the simulator model example, therefore ifit is changed, Test bench 1 would not need to be rerun.

At a more abstract level, if C1, Schematic view is changed, thereforechanging the schematic view in Instance 1 and 2, which affects a changein the information stamped in the simulator matrix, Test bench 1 wouldneed to be rerun. If a non-substantive change to C1, Schematic view ismade for example by adding a comment and no change is made to theinformation stamped by the simulator in the matrix, this designconfiguration would not need to be rerun. It is apparent thatdetermining whether a change was made to a configuration and the effectof the stamping of the matrix, may have a large effect on the number ofnecessitated verification runs.

FIG. 7 shows some of the different model views that may be chosen fromfor modeling a power management chip PMIC 700. The PMIC_testbench hasBehavioral_vams and Behavioral_va levels having stimulus and oututs. ThePMIC has Schematic and Schematic_behavioral levels. The LDO, LDO EnableControl and Battery Supervisor are defined at the Schematic,Schematic_behavioral and Behavioral_vams levels. The Voltage Reference,LDO Feedback and LDO Comparator are defined at the Schematic andBehavioral_va levels. The LDO Amplifier is defined at the Schematic andSchematic_parasitics levels. The Behavioral Amplifier and BehavioralBias are defined at the Behavior_va level. The LDO Control Logic isdefined at the Schematic and Verilog™ levels, and Devices 1 through Xare defined at the Spice level.

FIG. 8 shows a first test hierarchy of the power management chip PMICdescribed in FIG. 6 for a power management chip 800. The figureillustrates a portion of the hierarchy if a Spice primitive componentconfiguration is defined. Device 1, Instance 2 is a dummy device in thismodel and would not change the simulator matrix.

FIG. 9 shows a second test hierarchy of the power management chip PMICdescribed in FIG. 7 for a power management chip 900. The figureillustrates a portion of the hierarchy for one possible mixedconfiguration with some analog behavioral level models, some Verilog™representations and some Spice primitive components.

FIG. 10 shows a third test hierarchy of the power management chip PMICdescribed in FIG. 7 for a power management chip 1000. The figureillustrates a portion of the hierarchy if a behavioral configuration isdefined.

FIG. 11 depicts a simple example of an operational amplifier with sometypical features of an amplifier included within a largersystem-on-a-chip (SOC). Even this simple example can demonstrate theincreasing complexity of today's verification challenges formixed-signal designs. Feeding the inputs to the amplifier is a simplemultiplexer (mux). The control signal IN_CTRL to the mux will serve as adigital input signal to a series of logic gates within the mux block.These gates will then control the switches to select between two pairsof analog inputs: pair one (IN_POS_1 and IN_NEG_1) and pair 2 (IN_POS_2and IN_NEG_2). For instance, a value of IN_CTRL equal to logic level “0”could close the switches connected to IN_POS_1 and IN_NEG_1 while anIN_CTRL value of logic level “1” could close the switches connected toIN_POS_2 and IN_NEG_2. The analog inputs selected are then output fromthe mux. These signals are now connected to the amplifier inputs. Themux block also has connections for the power supplies. In this casebecause analog signals will pass through the block, the power supplyconnections are to the analog supply voltages AVDD and GND.

For the amplifier block, the power supply connection is also to theanalog supply voltage AVDD and GND. Note that it is not unusual oncomplex SOC's to have multiple internal power supplies. Even for theanalog blocks there may be options such as different power supplylevels. In other cases, the same voltage level may be supplied, but onesupply source may be used for critical blocks that may be susceptible toany noise on the supply line. Other blocks that are noisier (typicallydue to functions such as high frequency switching), may be connected toa different supply source that is the same voltage level. For thisreason, digital blocks are almost always powered separately from analogblocks. In addition, with the increasing importance of reducing power,some power supplies may be turned off during various operating modes. Asa result, design engineers may also need to verify that a given block isconnected to a supply that will be available at the appropriate times.

Another common configuration within a larger chip is to have a commonblock that provides many of the biasing currents required by analogfunctions. In this example, the amplifier has an input for a 1 uA biascurrent. Other common options include signals for trim and control orprogrammability. In this example, the amplifier has 2 control bits,GAIN_CTRL<1:0>, that can set a gain value and 3 bits, GAIN_TRIM<2:0>,that would slightly tune the gain value. Trim is typically performedwhen each device is tested and is used to compensate for manufacturingprocess variations and match the desired gain values to specified valuesas closely as possible. In this case GAIN_CTRL is a programmabilityfeature to pick the best gain setting for a specific application. TheENABLE signal allows the amplifier to be powered on or off while thechip is operating. These types of controls are often provided tominimize power consumption, allow for clean power up sequences of thechip, and to provide protection during fault conditions.

For this simple example, there are numerous examples of verificationrequirements. These requirements can be separated into severalcategories:

-   -   operating function—do the amplifier and mux meet their        respective functional requirements        -   does the mux correctly pass the selected input signals to            the mux output        -   does the amplifier meet it's expected behavior: gain, slew            rate, input range, output range, etc.    -   power supply and biasing        -   is the block connected to the appropriate power supply and            receiving the correct biasing        -   is the supply and biasing available when expected and            operating within the expected range    -   control signals        -   for every setting of control signals, is the correct            behavior observed    -   fault conditions        -   when any of the block pins behaves in an manner outside            allowed or expected ranges, does the block behave            appropriately or is that condition either not possible            (prevented elsewhere) or not expected to be handled

Within the context of this patent, much of the value results from moreefficiently managing the process of stepping through many combinationsof possibilities. One of the best examples is just stepping throughlarge numbers of digital control or trim options. Furthermore, bylinking to a specification database, requirements that change throughthe course of the design process can be easily updated and managed andsimulations rerun if necessary based on the specification databasechanges. Further the results from the verification activity can then becompared back to the requirements managed within the specificationdatabase.

Consider this simple example within the context of a larger SOC and atop-level test bench for this SOC. This test bench may be one of manytest benches for the chip, but this example can show how verificationintellectual property developed for the amplifier can be leveraged evenfrom a top-level test bench. The hierarchical concepts illustrated inFIG. 6 can be populated to show how an example test bench can be built.In this example A1 from FIG. 6 will represent the top-level test benchthat includes the chip, all the necessary circuits or models torepresent the system inputs, output loads, and external power suppliesor other components for the chip, as well as portions of the testsconfiguration that can be described programmatically through software.This example hierarchy can be seen in the diagram in FIG. 6. Asdiscussed previously, each item in the hierarchy can be represented bymultiple types of views depending on the information available and theintended purpose of the block.

The second level of hierarchy in this example that correlates to level“B” in FIG. 6 will include all the elements placed in this top-leveltest bench. The first element will be the chip itself. In this example,the chip is identified as cell B1. B2 could be a cell that containscircuits or models to represent the system inputs to the chip. B3 couldbe a cell that contains circuits or models to represent the systemprovided power supplies and system output loads seen by the chip. B4 inthis example will be a block written in software to connect eitherdirectly to pins of the chip or other blocks, provide values to anyparameterized functions within any of the blocks, and/or monitor andmeasure specific performances during the simulation. In this simplifiedexample, only signals that lead to the creation of the signals in thelower level example amplifier block are included.

This block B4 (or blocks) that can be captured in software willtypically use high-level languages targeted at integrated circuit design(SystemVerilog, Verilog, Verilog-AMS, Verilog-A, SystemC, VHDL, etc.)but can also leverage more general languages and scripts such as C, C++,TCL, PERL, etc. The software portions may create stimulus, define designvalues for parameters in existing circuit or system blocks, or measureand monitor performance throughout the simulation. For example, theUniversal Verification Methodology (UVM) for SystemVerilog includescommon constructs for defining monitoring and scoreboard functions aswell as defining stimulus. Digital verification methodology alsoincludes numerous specific pieces of verification intellectual property(VIP) that are targeted to specific functions or protocols. Forinstanced defined communication standards such as Universal Serial Bus(USB), Serial Peripheral Interface (SPI) bus, etc. will have specificverification IP that can be leveraged during the verification processboth to supply data through the interface and also test and validatethat the interface is matching the protocol standards. In this example,the digital trim and controls will be assumed programmed through a SPIinterface or by the chip itself.

In the testbench of FIG. 12, the external power supply VDD_EXT is beinggenerated by Verilog-A code within the TOP_AMST. Then VDD_EXT is aninput for the SUPPLIES_AND_OUTPUTS block. That block then outputs VDDwhich is connected to the SOC as the primary external power supply. Forthe inputs, the system inputs are generated within the INPUTS block andthen passed through the TOP_AMST block before connecting to the SOC.Passing the inputs through the test harness allows both the voltage andcurrent of the input signals to be monitored (or used as parameters forother calculations) throughout the simulation. Similarly VOUT from theSOC is passed through the TOP_AMST before entering theSUPPLIES_AND_OUTPUTS block. Finally, the VOUT_EXT is fed from theSUPPLIES_AND_OUTPUTS block to the TOP_AMST for monitoring. The decisionson which signals should be passed through the AMST test harness blocksare highly dependent on the system and the amount of circuits/modelsrequired around the chip to adequately represent the full system.Ultimately these decisions are driven by the system design and theverification plan.

In FIG. 13, signals at lower levels of the hierarchy cannot be accessedunless those signals are brought to a pin at the top-level. Considerfurther the hierarchy of Instance B1 which represents the chip. In thisexample, the next level of the chip's hierarchy will contain C1, thechip_core, and C2, the chip_pad_ring. Then push down into C1 to see D1,the amp_core subsystem from above; D2, pwr_mgt (power managementfunctions for the chip); and D3, digital_control.

In FIG. 15, Further descending into the amp_core subsystem shows thesubsystem elements: E1, the mux; E2, the amp; and E3, the amp_AMST whichis a VerilogAMS block containing verification IP for this subsystem.

Consider the case of a simple bandgap with digital trim bits. Thepurpose of the circuit is to generate a predictable output voltage overenvironmental (e.g. temperature) variation and process (e.g. oxidethickness) variation. The digital trim bits offer a range of outputvalues with predictable step size. The AMST for this bandgap needs todefine the entire test circuit for the bandgap including power supplies,load components, and digital trim values. For starters, let's take alook at a definition of a simple supply:

# supply start ramp time my $glSupplyRampStartObj =$glAMSTObj−>create_variable(“glSupplyRampStartDbl”, 50e−9); # supplystop ramp time my $glSupplyRampEndObj =$glAMSTObj−>create_variable(“glSupplyRampEndDbl”, 100e−9); # supplyvoltage value my $glAvddValObj =$glAMSTObj−>create_variable(“glAvddValDbl”, 5); # create PWL for supply$glAMSTObj−>create_vpwl( “arP0” => “AVDD”, “arP1” => “AVSS”, “arPwlRef”=> [ 0, 0, $glSupplyRampStartObj, 0, $glSupplyRampEndObj, $glAvddValObj ] );

This example creates a simple piece-wise linear supply that is 0V att=0, 0V at t=50 ns, 5V at t=100 ns. Notice that all the variables areparameterized. A program can read in this AMST file and then extract alist of variables and their types. This capability allows the user tomodify/sweep these values and build a variety of test vectors from thesame group of AMST test benches. Additional circuit components can alsobe instantiated by reference. For example, the code below adds aVerilog-A load resistor to the bandgap:

# define the load resistor programmatically$glAMSTObj−>add_module_instance( “arModuleName” => “resistor”,“arModuleFilename” => “behav_resistor.va”, “arParameterValueMap” => {“r” => $glOutputLoadObj }, “arNodeNetMap” => {  “IN_NODE0” => “VBG”, “OUT_NODE1” => “AVSS”, }  );

The bandgap needs to be tested for all possible trim bit combinations.The following syntax sets up a full factorial experiment on all the trimbits:

# test all possible combinations of the digital inputs$glAMSTObj−>create_voltage_full_factorial( “arFactDelay” =>$glSupplyRampEndObj, “arFactStateValRef” => [0, $glAvddValObj],“arFactStateDurRef” => [0.50, 0.50], “arFactChgTimeRef” => [2e−9, 2e−9],“arFactMinPeriod” => 10e−6, “arFactSignalRef” => [ {“arP0”=>“DTRIM[0:2]”, “arP1”=>“AVSS”} ] ); gets expanded into: moduleamst(...) output [2:0] DTRIM; electrical [2:0] DTRIM; output AVSS;electrical AVSS; parameter real glSupplyRampEndDbl = 1e−07; parameterreal glAvddValDbl = 5; real loDtrimVal2loAvssValBit0; realloDtrimVal2loAvssValBit1; real loDtrimVal2loAvssValBit2; analog begin @(initial_step) begin loDtrimVal2loAvssValBit0 = 0;loDtrimVal2loAvssValBit1 = 0; loDtrimVal2loAvssValBit2 = 0; end ... //DTRIM[0] @(timer(glSupplyRampEndDbl, 1e−05, 1p))loDtrimVal2loAvssValBit0 = 0; @(timer((glSupplyRampEndDbl + 0.5 *1e−05), 1e−05, 1p)) loDtrimVal2loAvssValBit0 = glAvddValDbl; V(DTRIM[0],AVSS) <+ transition(loDtrimVal2loAvssValBit0, 0, 2e−09, 2e−09); //DTRIM[1] @(timer(glSupplyRampEndDbl, (1e−05 * 2), 1p))loDtrimVal2loAvssValBit1 = 0; @(timer((glSupplyRampEndDbl + (0.5 *1e−05 * 2)), (1e−05 * 2), 1p)) loDtrimVal2loAvssValBit1 = glAvddValDbl;V(DTRIM[1], AVSS) <+ transition(loDtrimVal2loAvssValBit1, 0, 2e−09,2e−09); // DTRIM[2] @(timer(glSupplyRampEndDbl, (1e−05 * 4), 1p))loDtrimVal2loAvssValBit2 = 0; @(timer((glSupplyRampEndDbl + (0.5 *1e−05 * 4)), (1e−05 * 4), 1p)) loDtrimVal2loAvssValBit2 = glAvddValDbl;V(DTRIM[2], AVSS) <+ transition(loDtrimVal2loAvssValBit2, 0, 2e−09,2e−09); ... endmodule

The definition above states that there are 3 trim signals. Each signalhas 2 valid values that need to be tested. A full factorial willenumerate all possible states. Thus, for 3 binary variables, you get aset of 8 periods that test all valid signal combinations. Once the testcircuit and the stimulus has been defined, the measurements andassertions need to be defined. An example of a simple voltagemeasurement:

my $glVbgTrim0MeasObj = $glAMSTObj−>create_voltage_measure(“arMeasureNet” => “VBG”, “arRefNet” => “AVSS”, “arMinVal” => 0.850,“arMaxVal” => 0.900 );

This voltage measurement is true whenever the output node VBG is between0.850 and 0.900. This measurement is performed and evaluated at everytime step of the simulation. A collection of boolean measurements can becombined to create conditional assertions. For example, the assertionbelow states that when the DTRIM[2:0] bits are at “000” and the VDDsupply is above its minimum threshold, the $g1VbgTrim0MeasObjmeasurement defined above (0.850<=VBG<=0.900) must be true.

# when DTRIM=“000” => VBG=0.9 $glAMSTObj−>create_conditional_assert(“arAssertNameStr” => ‘when DTRIM=\“000\” => VBG=0.9’, “arCondition” =>assert_and( $glVddAboveMin, assert_not($glDtrim0MeasObj),assert_not($glDtrim1MeasObj), assert_not($glDtrim2MeasObj) ),“arAssertDelay” => $loMeasureDelayDbl, “arAssert” => assert_and($glVbgTrim0MeasObj, $glPgoodMeasObj ), “arAssertAtLeastOnce” => 1  );

It would have been simpler to measure the output voltage at some pointin time (e.g. VBG must be between 0.850 and 0.900 at 100 us). This typeof check is also easily implementable in AMSTL. But the assertion aboveis much more powerful because it explicitly captures a subset of thebandgap spec (e.g. “when DTRIM=000=>VBG=0.9”) and validates that thispart of the spec is true whenever the assertion conditions have beensatisfied, not just at a single point in time.

In the next example code below generates direct branch contributionstatements for the purpose of measurement. In this example, we have a 16wire bus of reference currents. We use the syntax below to insure thecurrent is between 0.9*750 nA and 1.1*750 nA after 1 us.

zip_setup_std_supplies(  50e−09, 100e−09,  [  [“Ib_750n_AMST_IN[0:15]”,“Ib_750n_AMST_OUT[0:15]”, 0]  ] ); zip_assert_output_currents( 0.9, 1.1,1e−06, {  “Ib_750n_AMST_IN[0:15]” => 750e−09 } ); ... parameter realloSupplyRampStartDbl = 5e−08; parameter real loSupplyRampEndDbl = 1e−07;parameter real loIb_750n_AMST_INValDbl = 0; parameter realarVolEnGndMin1 = 2.85; parameter real arVolEnGndMax1 = 3.15; parameterreal arCurIb_750n_amst_in0Min1 = 6.75e−07; parameter realarCurIb_750n_amst_in0Max1 = 8.25e−07; real loChangeTimeV1; realloIb_750n_amst_inValbit0; // create analog conditional assert 1 integerloVolEnGndAboveMin1; integer loVolEnGndAboveMax1; integerloCurIb_750n_amst_in0AboveMin1; integer loCurIb_750n_amst_in0AboveMax1;integer loCondition1; integer loOldCondition1; integer loSat1; integerloFail1; integer loDisplay1; integer loAssert1; integer loMeasure1; realloCheckTime1; integer loAssertOutOn1; analog begin @ (initial_step)begin loChangeTimeV1 = 0; loIb_750n_amst_inValBit0 = 0; // create analogconditional assert 1 loVolEnGndAboveMin1 = 0; loVolEnGndAboveMax1 = 0;loCurIb_750n_amst_in0AboveMin1 = 0; loCurIb_750n_amst_in0AboveMax1 = 0;loCondition1 = 0; loOldCondition1 = 0; loSat1 = 0; loFail1 =0;loDisplay1 = 0; loAssert1 = 0; loMeasure1 = 0; loCheckTime1 = 0;loAssertOutOn1 = 0; end V(NEG_Ib_750n_amst_in0, Ib_750n_AMST_OUT[0]) <+transition(loIb_750n_amst_inValBit0, 0, loChangeTimeV1, loChangeTimeV1);V(Ib_750n_AMST_IN[0], NEG_Ib_750n_amst_in0) <+ 0; // CURRENT: when2.85<EN<3.15 ==> 6.75e−07 < Ib_750n_AMST_IN[0] < 8.25e− 07 loDisplay1 =1; {grave over ( )}ZIP_VCROSS_TO_BLN(EN, GND, arVolEnGndMin1,loVolEnGndAboveMin1); {grave over ( )}ZIP_VCROSS_TO_BLN(EN, GND,arVolEnGndMax1, loVolEnGndAboveMax1); {grave over( )}ZIP_ICROSS_TO_BLN(Ib_750n_AMST_IN[0], NEG_Ib_750n_amst_in0,arCurIb_750n_amst_in0Min1, loCurIb_750n_amst_in0AboveMin1); {grave over( )}ZIP_ICROSS_TO_BLN(Ib_750n_AMST_IN[0], NEG_Ib_750n_amst_in0,arCurIb_750n_amst_in0Max1, loCurIb_750n_amst_in0AboveMax1); loCondition1= (loVolEnGndAboveMin1 && !loVolEnGndAboveMax1); if (loCondition1 &&!loOldCondition1) begin loAssertOutOn1 = 0; loCheckTime1 = $abstime +1e−06; end @(timer(loCheckTime1)) begin loAssertOutOn1 = 1; endloAssert1 = (loCurIb_750n_amst_in0AboveMin1 &&!loCurIb_750n_amst_in0AboveMax1); if (loCondition1 && loAssertOutOn1)begin loMeasure1 = loAssert1; if ((loSat1 && !loFail1 && loMeasure1) ∥(!loSat1 && loFail1 && !loMeasure1)) begin loDisplay1 = 0; end if(loDisplay1) begin if (loMeasure1) begin loSat1 = 1; loFail1 = 0;$fdisplay(fileDescriptor, “CURRENT: when 2.85<EN<3.15 ==> 6.75e−07 <Ib_750n_AMST_IN[0] < 8.25e−07 succeeds %e”, $abstime); end else beginloSat1 = 0; loFail1 = 1; $fdisplay(fileDescriptor, “CURRENT: when2.85<EN<3.15 ==> 6.75e−07 < Ib_750n_AMST_IN[0] < 8.25e−07 fails %e”,$abstime); end end end loOldCondition1 = loCondition1; end

In one example, FIG. 16 illustrates an electronic design to netlistcomputer implemented method 1600 of translation of verification commandsof an electronic design that comprises the steps of receiving 1610 theelectronic design and receiving 1612 at least one analog test harnessmodel having at least one indirect branch contribution statement andhaving at least one of at least one specification parameter stored in atleast one specification database and at least one stimulus parameterstored in at least one specification database and at least onemeasurement parameter stored in at least one specification database. Themethod also comprises the steps of translating 1614 the at least oneindirect branch contribution statement into a plurality of direct branchcontribution operators based at least in part upon the at least oneanalog test harness model and the at least one of at least onespecification parameter stored in at least one specification databaseand at least one stimulus parameter stored in at least one specificationdatabase and at least one measurement parameter stored in at least onespecification database and generating 1616 a netlist based at least inpart upon the translation. The electronic design may encompass multiplelevels of hierarchy. The analog test harness may exist as a module atthe lowest level, in which it acts as a packaged test-bench along withthe circuit to any of the hierarchical levels. Referring back to FIG. 6,the electronic design would encompass each connected block in the figurewhich incorporates different hierarchical levels. The top levelhierarchy is A1, the next level of hierarchy is B, which includes B1 andB2 and underneath the B hierarchy is the C hierarchy having C1, C2 andC3. In this specific example at the B1 level and below the model iscomprised of Schematic and Spice models. At the B2 level the modelencompasses Schematic_behavioral and Behavioral_va models. In thisinstance the analog test model would be connected to A1, instance 1level and would be connected through the netlist, connecting lines toeach of the components under test.

In one example, the indirect branch contribution statements may belooping in which a sequence of instructions are repeated until an exitcondition is met. The indirect statement may also be conditional inwhich an action is taken based on a true or false Boolean condition,nomenclature based in which the naming of the input, output or device isparsed and infers a set of instructions and analysis based in whicheither an output or input to a net is analyzed and a decision is madebased upon the analysis.

The analog test harness model may be located at any level in thehierarchy of the design from the top block level to an individualcircuit and the like. One example of the analog test harness model isone in which it is described within a low level block and forms a modulewithin the design in which the testing module is included within theindividual block. One possible benefit associated with including theanalog test harness model within an individual block is that it may besent with the circuit design to support a self-verification within themodule. In some use models, the test harness model may be connected bynet or port names used within the test harness and not physically placedin the schematic, but the test harness model will be included in thenetlist. This approach is often used within analog and mixed-signaldesign to include information that can be managed more easily as aseparate text file but will be included within the netlist. Examplesinclude SPICE model files of basic components such as transistors,behavioral models that are written in a programming or hardware languageand register-transfer level (RTL) descriptions of digital functions.

In one example, the netlist provides the connectivity of the electronicdesign, in essence which terminals on one device are connected to whichterminals on another device. The netlist may also contain devicespecifics for each of the devices.

In one example, the translation of the indirect branch contributionstatement into multiple direct branch contribution operators based onthe analog test harness model is a conversion of one blanket statementinto a series of individual statements that encompass the span of theblanket statements. In essence on statement “index conditions<1:10>”would be broken into “condition 1”, “condition 2” . . . “condition 10”.

The translation may utilize a standardized analog hardware descriptionlanguage that may comprise at least of at least one of Verilog-A™ syntaxand Verilog-AMS™ syntax.

In another example, FIG. 17 illustrates an electronic design to netlistcomputer implemented method 1700 of translation of verification commandsof an electronic design which comprises the steps of, receiving 1710 arepresentation of the electronic design and receiving 1712 along withthe representation of the electronic design, at least one analog testharness model having at least one indirect branch contribution statementand having at least one of at least one specification parameter storedin at least one specification database and at least one stimulusparameter stored in at least one specification database and at least onemeasurement parameter stored in at least one specification database. Themethod further comprises translating 1714 the at least one indirectbranch contribution statement into a plurality of direct branchcontribution operators based at least in part upon the at least oneanalog test harness model and the at least one of at least onespecification parameter stored in at least one specification databaseand at least one stimulus parameter stored in at least one specificationdatabase and at least one measurement parameter stored in at least onespecification database and the electronic design and generating 1716 anetlist based at least in part upon the translation. Referring back toFIG. 7, each of the hierarchies and models of the example design areshown. One of the goals of verification is to test each block and eachmodel of the design at appropriate conditions. Translating indirectbranch contribution statements aids in this multi-dimensional task byautomating at least a portion of the cycling.

The at least one analog test harness model may have at least onestimulus, at least one stimulus assertion, at least one output assertionand/or at least one output measurement. The representation of theelectronic design may be analog or mixed signal, may comprise at leastone transistor level circuitry, at least one behavioral modeledcircuitry, at least one circuit based upon at least one parasitic modelbased at least in part upon a physical design and/or at least onebehavioral modeled circuit.

In another example, FIG. 18 illustrates an electronic design to netlistcomputer implemented method 1800 of translation of verification commandsof an electronic design that comprises the steps of receiving 1810 arepresentation of the electronic design, receiving 1812 at least oneanalog test harness model having at least one of at least one stimulusand at least one stimulus assertion and having at least one of at leastone specification parameter stored in at least one specificationdatabase and at least one stimulus parameter stored in at least onespecification database and at least one measurement parameter stored inat least one specification database and receiving 1814 at least oneverification subroutine command for the electronic design, the at leastone verification subroutine command having at least one indirect branchcontribution statement. The method also comprises the steps oftranslating 1816 the at least one verification subroutine command intocorresponding standardized analog hardware description language based atleast in part upon the at least one verification subroutine command, theat least one analog test harness model and the at least one of at leastone specification parameter stored in at least one specificationdatabase and at least one stimulus parameter stored in at least onespecification database and at least one measurement parameter stored inat least one specification database and the electronic design andgenerating 1818 a netlist based at least in part upon the translation. Astimulus assertion may define property definitions, constraints and thelike within an electronic system. Referring back to FIG. 8, theelectronic design would encompass each of the connected blocks followingthe PMIC_testbench, and at least one analog test harness model wouldpertain to the block marked PMIC_testbench. The netlist for that modelwould indicate each connection, connecting line in FIG. 8. Thehierarchies associated with this design indicate that the LDO, BatterySupervisor and Voltage Reference blocks are lower in hierarchy than thePMIC block. Additionally, this model primarily reviews the schematicportion of the design. The ability to translate at least one indirectbranch contribution statement into a plurality of direct branchcontribution operators may increase the efficiency of reviewing each ofthe hierarchies and each of the portions of the design for each block inthe design.

The standardized analog hardware description language may comprise atleast of at least one of Verilog-A™ syntax and Verilog-AMS™ syntax. Theat least one analog test harness model may have at least one of at leastone output assertion and at least one output measurement.

In another example, FIG. 19 illustrates an electronic design to anetlist via verification subroutines of a computer implemented method1900 of translation of verification commands of an electronic designwhich comprises the steps of, receiving 1910 a representation of theelectronic design, receiving 1912 at least one analog test harness modelhaving at least one of at least one output assertion and at least oneoutput measurement and having at least one of at least one specificationparameter stored in at least one specification database and at least onestimulus parameter stored in at least one specification database and atleast one measurement parameter stored in at least one specificationdatabase and receiving 1914 at least one verification subroutine commandfor the electronic design, the at least one verification subroutinecommand having at least one indirect branch contribution statement. Themethod also comprises the steps of translating 1916 the at least oneverification subroutine command into corresponding at least one ofstandardized analog hardware description language based at least in partupon the at least one verification subroutine command, the at least oneanalog test harness model and the at least one of at least onespecification parameter stored in at least one specification databaseand at least one stimulus parameter stored in at least one specificationdatabase and at least one measurement parameter stored in at least onespecification database and the electronic design and generating 1918 anetlist based at least in part upon the translation. Referring back toFIG. 9, the electronic design would encompass each of the connectedblock following the PMIC_testbench, and at least one analog test harnessmodel would pertain to the block marked PMIC_testbench. The netlistwould indicate the connectivity, shown by the lines connecting each ofthe blocks. The hierarchies associated with this design indicate thatthe LDO, Battery Supervisor and Voltage Reference blocks are lower inhierarchy than the PMIC block. This model reviews the schematic,schematic behavioral and behavioral.va aspects of the model. Though theoverall electronic design is the same as in FIG. 8, what is tested, thehierarchies and connectivity are different. The ability to translate atleast one indirect branch contribution statement into a plurality ofdirect branch contribution operators aids in reviewing the differentmodels and hierarchies in a more thorough manner.

The standardized analog hardware description language may comprise atleast of at least one of Verilog-A™ syntax and Verilog-AMS™ syntax. Theat least one verification subroutine command may have at least onespecification subset. The at least one analog harness model may validatethe at least one specification subset based at least in part upon the atleast one of at least one output assertion and at least one outputmeasurement. The at least one specification subset may have a datatransformation.

In another example, FIG. 20 illustrates an electronic design throughextracted data comparison computer program product embodied on anon-transitory computer usable medium 2000, the non-transitory computerusable medium having stored thereon a sequence of instructions which,when executed by a processor causes the processor to execute a method oftranslation of verification commands of an electronic design, the methodcomprises the steps of, receiving 2010 at least one analog test harnessmodel having at least one of at least one stimulus and at least onestimulus assertion and wherein the at least one analog test harnessmodel having at least one of at least one specification parameter storedin at least one specification database and at least one stimulusparameter stored in at least one specification database and at least onemeasurement parameter stored in at least one specification database withat least one of said parameters treated as a parameterized variable andreceiving 2012 at least one verification subroutine command for theelectronic design, the at least one verification subroutine commandhaving at least one indirect branch contribution statement. The methodalso comprises the steps of retrieving 2014 at least one rule based atleast in part on the at least one analog test harness and the at leastone verification subroutine command and translating 2016 the at leastone verification subroutine command into corresponding to at least oneof standardized analog hardware description language based at least inpart upon the at least one verification subroutine command, theretrieved at least one rule, the at least one analog test harness model,the at least one of at least one specification parameter stored in atleast one specification database and at least one stimulus parameterstored in at least one specification database and at least onemeasurement parameter stored in at least one specification database withat least one of said parameters treated as a parameterized variable andthe electronic design. The method further comprises the steps ofgenerating 2018 a netlist based at least in part upon the translation,electrically simulating 2020 at least one subcomponent utilizing atleast in part the at least one analog test harness model, extracting2022 at least one performance attribute of the electronic designundergoing the electrical simulation and comparing 2024 the extracted atleast one performance attribute and at least one output measurement.Referring back to FIG. 10, the electronic design would encompass each ofthe connected blocks following the PMIC_testbench, and at least oneanalog test harness model would pertain to the block markedPMIC_testbench. In this example the PMIC hierarchy and the LDO, BatterySupervisor and Voltage Reference hierarchies are reviewed. At thehighest level the PMIC is reviewed at the schematic level and the LDO atthe Behavioral_vams, the Battery Supervisor at the Behavioral_vams andthe Voltage reference at the Behavioral_va level.

The computer program product may further comprise the steps of fixingthe at least one parameterized variable, of varying the at least oneparameterized variable in at least one separate simulation run and/orvarying the at least one parameterized variable within at least onesimulation run. The at least one performance attribute may be extractedduring the simulation or extracted after the simulation. The at leastone analog test harness model may have at least one of at least oneoutput assertion and at least one output measurement.

In another example, FIG. 21 illustrates an electronic design throughextracted data comparison of computer program product embodied on anon-transitory computer usable medium 2100, the non-transitory computerusable medium having stored thereon a sequence of instructions which,when executed by a processor causes the processor to execute a method oftranslation of verification commands of an electronic design, the methodcomprises the steps of, receiving 2110 at least one analog test harnessmodel having at least one of at least one output assertion and at leastone output measurement, wherein the at least one analog test harnessmodel having at least one of at least one specification parameter storedin at least one specification database and at least one stimulusparameter stored in at least one specification database and at least onemeasurement parameter stored in at least one specification database withat least one of said parameters treated as a parameterized variable andreceiving 2112 at least one verification subroutine command for theelectronic design, the at least one verification subroutine commandhaving at least one indirect branch contribution statement. The methodalso comprises the steps of retrieving 2114 at least one rule based atleast in part on the at least one analog test harness and the at leastone verification subroutine command, translating 2116 the at least oneverification subroutine command into corresponding to at least one ofstandardized analog hardware description language based at least in partupon the at least one verification subroutine command, the retrieved atleast one rule, the at least one analog test harness model, the at leastone of at least one specification parameter stored in at least onespecification database and at least one stimulus parameter stored in atleast one specification database and at least one measurement parameterstored in at least one specification database with at least one of saidparameters treated as a parameterized variable and the electronic designand generating 2118 a netlist based at least in part upon thetranslation. The method further comprises the steps of electricallysimulating 2120 at least one subcomponent utilizing at least in part theat least one analog test harness model, extracting 2122 at least oneperformance attribute of the electronic design undergoing the electricalsimulation and comparing 2124 the extracted at least one performanceattribute and the at least one of at least one output assertion and atleast one output measurement. Referring back to FIG. 10, the electronicdesign would encompass each of the connected blocks following thePMIC_testbench, and at least one analog test harness model would pertainto the block marked PMIC_testbench. In this example the PMIC hierarchyand the LDO, Battery Supervisor and Voltage Reference hierarchies arereviewed. At the highest level the PMIC is reviewed at the schematiclevel and the LDO at the Behavioral_vams, the Battery Supervisor at theBehavioral_vams and the Voltage reference at the Behavioral_va level.

The standardized analog hardware description language may comprise atleast one of Verilog-A™ and Verilog-AMS. The method may further comprisethe steps of modifying the at least one analog test harness model basedat least in part upon a designated outcome, modifying the at least oneverification subroutine command based at least in part upon a designatedoutcome and/or modifying the at least one parameterized variable. Theelectronic design may result in at least one of at least one activecircuit and at least one passive circuit, wherein the electronic designresulting in at least one active circuit may adjust at least one of atleast one gain and at least one direction of at least one electricalsignal. The at least one verification subroutine command may have atleast one specification subset and the at least one analog harness modelmay validate the at least one specification subset based at least inpart upon the at least one of at least one output assertion and at leastone output measurement.

While the making and using of various exemplary examples of thedisclosure are discussed herein, it is to be appreciated that thepresent disclosure provides concepts which can be described in a widevariety of specific contexts. Although the disclosure has been shown anddescribed with respect to a certain example, it is obvious thatequivalents and modifications will occur to others skilled in the artupon the reading and understanding of the specification. The presentdisclosure includes such equivalents and modifications, and is limitedonly by the scope of the following claims.

It is to be understood that the method and apparatus may be practicedlocally, distributed or remotely and that the data for steps may bestored either locally or remotely. For purposes of clarity, detaileddescriptions of functions, components, and systems familiar to thoseskilled in the applicable arts are not included. The methods andapparatus of the disclosure provide one or more advantages includingwhich are not limited to, improved speed efficiency, decreasedcomputation time, decreased number of re-verifications and the like.While the disclosure has been described with reference to certainillustrative examples, those described herein are not intended to beconstrued in a limiting sense. For example, variations or combinationsof steps in the examples shown and described may be used in particularcases while not departing from the disclosure. Various modifications andcombinations of the illustrative examples as well as other advantagesand examples will be apparent to persons skilled in the arts uponreference to the drawings, description, and claims.

What is claimed is:
 1. A computer implemented method of translation ofverification commands of an electronic design file of an electroniccircuit defined by the electronic design file, comprising the steps of:receiving, at a processor, said electronic design file defining theelectronic circuit, wherein the electronic design file defines afunctional level electronic design of the electronic circuit; receiving,at the processor, at least one analog test harness model associated withthe electronic circuit having at least one indirect branch contributionstatement and having at least one of at least one specificationparameter stored in at least one specification database associated withthe electronic design file, at least two stimulus parameters stored inthe at least one specification database associated with the electronicdesign file and at least one measurement parameter stored in the atleast one specification database associated with the electronic designfile, a first stimulus parameter of the at least two stimulus parameterscomprising an input to an input pin of the electronic circuit defined bythe electronic design file; translating, at the processor, said at leastone indirect branch contribution statement into a plurality of directbranch contribution operators based at least in part upon said at leastone analog test harness model associated with the electronic circuit andsaid at least one of at least one specification parameter stored in theat least one specification database associated with the electronicdesign file, said at least two stimulus parameters stored in the atleast one specification database associated with the electronic designfile and said at least one measurement parameter stored in the at leastone specification database associated with the electronic design file,wherein said translation has a standardized analog hardware descriptionlanguage; and generating, at the processor, a netlist for saidelectronic circuit based at least in part upon said translation of saidat least one indirect branch contribution statement.
 2. The computerimplemented method of translation of verification commands of saidelectronic design file of claim 1, wherein a second stimulus parameterof the at least two stimulus parameters comprises a stimulus applied tothe electronic circuit but not to a pin of the electronic circuit. 3.The computer implemented method of translation of verification commandsof said electronic design file of claim 2, wherein the second stimulusparameter of the at least two stimulus parameters comprises a stimulusfrom a group of stimulus consisting of voltage, current and temperature.4. The computer implemented method of translation of verificationcommands of said electronic design file of claim 1, wherein saidstandardized analog hardware description language comprises at least ofat least one of Verilog-A™ syntax and Verilog-AMS™ syntax.
 5. A computerimplemented method of translation of verification commands of anelectronic design file of an electronic circuit defined by theelectronic design file, comprising the steps of: receiving arepresentation of said electronic design file defining the electroniccircuit, wherein the representation of the electronic design filedefines a functional level electronic design of the electronic circuit;receiving, at a processor, along with said representation of saidelectronic design file of the electronic circuit, at least one analogtest harness model associated with the electronic circuit having atleast one indirect branch contribution statement and having at least oneof at least one specification parameter stored in at least onespecification database associated with the electronic design file, atleast two stimulus parameters stored in the at least one specificationdatabase associated with the electronic design file and at least onemeasurement parameter stored in the at least one specification databaseassociated with the electronic design file, a first stimulus parameterof the at least two stimulus parameters comprising an input to an inputpin of the electronic circuit defined by the electronic design file,wherein said at least one analog test harness model associated with theelectronic circuit having at least one stimulus; translating, at theprocessor, said at least one indirect branch contribution statement intoa plurality of direct branch contribution operators based at least inpart upon said at least one analog test harness model and said at leastone of at least one specification parameter associated with theelectronic design file stored in the at least one specification databaseassociated with the electronic design file, said at least two stimulusparameters stored in the at least one specification database associatedwith the electronic design file and said at least one measurementparameter stored in the at least one specification database associatedwith the electronic design file; and generating, at the processor, anetlist for said electronic circuit based at least in part upon saidtranslation of said at least one indirect branch contribution statement.6. The computer implemented method of translation of verificationcommands of said electronic design file of claim 5, wherein a secondstimulus parameter of the at least two stimulus parameters comprises astimulus applied to the electronic circuit but not to a pin of theelectronic circuit.
 7. The computer implemented method of translation ofverification commands of said electronic design file of claim 6, whereinthe second stimulus parameter of the at least two stimulus parameterscomprises a stimulus from a group of stimulus consisting of voltage,current and temperature.
 8. The computer implemented method oftranslation of verification commands of said electronic design file ofclaim 5, wherein said at least one analog test harness model associatedwith the electronic circuit having at least one stimulus assertion. 9.The computer implemented method of translation of verification commandsof said electronic design file of claim 5, wherein said at least oneanalog test harness model associated with the electronic circuit havingat least one stimulus assertion with at least one stimulus assertioncontaining at least two stimulus parameter from a specificationdatabase.
 10. The computer implemented method of translation ofverification commands of said electronic design file of claim 5, whereinsaid at least one analog test harness model associated with theelectronic circuit having at least one output assertion.
 11. Thecomputer implemented method of translation of verification commands ofsaid electronic design file of claim 5, wherein said at least one analogtest harness model associated with the electronic circuit having atleast one output assertion with at least one output assertion containingat least one specification parameter from a specification database. 12.The computer implemented method of translation of verification commandsof said electronic design file of claim 5, wherein said at least oneanalog test harness model associated with the electronic circuit havingat least one output measurement.
 13. The computer implemented method oftranslation of verification commands of said electronic design file ofclaim 5, wherein said at least one analog test harness model associatedwith the electronic circuit having at least one output measurement withat least one output assertion containing at least one measurementparameter from a specification database.
 14. The computer implementedmethod of translation of verification commands of said electronic designfile of claim 5, wherein said representation of said electronic designfile of the electronic circuit is analog.
 15. The computer implementedmethod of translation of verification commands of said electronic designfile of claim 5, wherein said representation of said electronic designfile of the electronic circuit is mixed signal.
 16. The computerimplemented method of translation of verification commands of saidelectronic design file of claim 5, wherein said representation of saidelectronic design file of the electronic circuit having at least onetransistor level circuitry.
 17. The computer implemented method oftranslation of verification commands of said electronic design file ofclaim 5, wherein said representation of said electronic design file ofthe electronic circuit having at least one behavioral modeled circuitry.18. The computer implemented method of translation of verificationcommands of said electronic design file of claim 5, wherein saidrepresentation of said electronic design file of the electronic circuithaving at least one circuit based upon at least one parasitic modelbased at least in part upon a physical design.
 19. The computerimplemented method of translation of verification commands of saidelectronic design file of claim 5, wherein said representation of saidelectronic design file of the electronic circuit having at least onebehavioral modeled circuit.
 20. A computer implemented method oftranslation of verification commands of an electronic design file of anelectronic circuit defined by the electronic design file, comprising thesteps of: receiving, at a processor, a representation of said electronicdesign file defining the electronic circuit; receiving, at theprocessor, at least one analog test harness model associated with theelectronic circuit having at least one of at least one stimulus and atleast one stimulus assertion and having at least one of at least onespecification parameter stored in at least one specification databaseassociated with the electronic design file, at least two stimulusparameters stored in the at least one specification database associatedwith the electronic design file and at least one measurement parameterstored in the at least one specification database associated with theelectronic design file, a first stimulus parameter of the at least twostimulus parameters comprising an input to an input pin of theelectronic circuit defined by the electronic design file, wherein saidat least one analog test harness model associated with the electroniccircuit has at least one of at least one output assertion and at leastone output measurement; receiving, at the processor, at least oneverification subroutine command for said electronic design file, said atleast one verification subroutine command having at least one indirectbranch contribution statement; translating, at the processor, said atleast one verification subroutine command into a correspondingstandardized analog hardware description language based at least in partupon said at least one verification subroutine command, said at leastone analog test harness model associated with the electronic circuit,said at least one of at least one specification parameter stored in theat least one specification database associated with the electronicdesign file, said at least two stimulus parameters stored in the atleast one specification database associated with the electronic designfile and said at least one measurement parameter from the at least onespecification database associated with the electronic design file; andgenerating, at the processor, a netlist for said electronic circuitbased at least in part upon said translation of said at least oneverification subroutine command.
 21. The computer implemented method oftranslation of verification commands of said electronic design file ofclaim 20, wherein said corresponding standardized analog hardwaredescription language comprises at least of at least one of Verilog-A™syntax and Verilog-AMS™ syntax.
 22. The computer implemented method oftranslation of verification commands of said electronic design file ofclaim 20, wherein a second stimulus parameter of the at least twostimulus parameters comprises a stimulus applied to the electroniccircuit but not to a pin of the electronic circuit.
 23. The computerimplemented method of translation of verification commands of saidelectronic design file of claim 22, wherein the second stimulusparameter of the at least two stimulus parameters comprises a stimulusfrom a group of stimulus consisting of voltage, current and temperature.24. A computer implemented method of translation of verificationcommands of an electronic design file of an electronic circuit definedby the electronic design file, comprising the steps of: receiving, at aprocessor, a representation of said electronic design file defining theelectronic circuit, wherein the electronic design file defines afunctional level electronic design of the electronic circuit; receiving,at the processor, at least one analog test harness model associated withthe electronic circuit having at least one of at least one outputassertion and at least one output measurement and having at least one ofat least one specification parameter stored in at least onespecification database associated with the electronic design file, atleast two stimulus parameters stored in the at least one specificationdatabase associated with the electronic design file and at least onemeasurement parameter stored in the at least one specification databaseassociated with the electronic design file, a first stimulus parameterof the at least two stimulus parameters comprising an input to an inputpin of the electronic circuit defined by the electronic design file;receiving, at the processor, at least one verification subroutinecommand for said electronic design file, said at least one verificationsubroutine command having at least one indirect branch contributionstatement, wherein said at least one verification subroutine commandhaving at least one specification subset; translating, at the processor,said at least one verification subroutine command into corresponding atleast one of standardized analog hardware description language based atleast in part upon said at least one verification subroutine command,said at least one analog test harness model associated with theelectronic circuit, said at least one of at least one specificationparameter stored in the at least one specification database associatedwith the electronic design file, said at least two stimulus parametersstored in the at least one specification database associated with theelectronic design file and said at least one measurement parameter fromthe at least one specification database associated with the electronicdesign file; and generating, at the processor, a netlist for saidelectronic circuit based at least in part upon said translation of saidat least one verification subroutine command.
 25. The computerimplemented method of translation of verification commands of saidelectronic design file of claim 24, wherein said at least one ofstandardized analog hardware description language comprises at least oneof Verilog-A™ syntax and Verilog-AMS™ syntax.
 26. The computerimplemented method of translation of verification commands of saidelectronic design file of claim 24, wherein a second stimulus parameterof the at least two stimulus parameters comprises a stimulus applied tothe electronic circuit but not to a pin of the electronic circuit. 27.The computer implemented method of translation of verification commandsof said electronic design file of claim 26, wherein the second stimulusparameter of the at least two stimulus parameters comprises a stimulusfrom a group of stimulus consisting of voltage, current and temperature.28. The computer implemented method of translation of verificationcommands of said electronic design file of claim 24, wherein said atleast one analog test harness model associated with the electroniccircuit validates said at least one specification subset based at leastin part upon said at least one of at least one output assertion and atleast one output measurement.
 29. The computer implemented method oftranslation of verification commands of said electronic design file ofclaim 24, wherein said at least one analog test harness model associatedwith the electronic circuit validates said at least one specificationsubset based at least in part upon said at least one of at least oneoutput assertion and at least one of at least one measurement parameterstored in at least one specification database associated with theelectronic design file, said at least two stimulus parameters stored inthe at least one specification database associated with the electronicdesign file and said at least one measurement parameters stored in theat least one specification database associated with the electronicdesign file.
 30. The computer implemented method of translation ofverification commands of said electronic design file of claim 24,wherein said at least one specification subset having a datatransformation.
 31. A computer program product embodied on anon-transitory computer usable medium, said non-transitory computerusable medium having stored thereon a sequence of instructions which,when executed by a processor causes said processor to execute a methodof translation of verification commands of an electronic design file ofan electronic circuit defined by the electronic design file, said methodcomprising the steps of: receiving, at a processor, at least one analogtest harness model associated with the electronic circuit having atleast one of at least one stimulus and at least one stimulus assertionand wherein said at least one analog test harness model associated withthe electronic circuit having at least one of at least one measurementparameter stored in at least one specification database associated withthe electronic design file, at least two stimulus parameters stored inthe at least one specification database associated with the electronicdesign file and at least one specification parameter stored in the atleast one specification database associated with the electronic designfile with at least one of said parameters treated as a parameterizedvariable, a first stimulus parameter of the at least two stimulusparameters comprising an input to an input pin of the electronic circuitdefined by the electronic design file, wherein said at least one analogtest harness model associated with the electronic circuit has at leastone of at least one output assertion and at least one outputmeasurement; receiving, at the processor, at least one verificationsubroutine command for said electronic design file, said at least oneverification subroutine command having at least one indirect branchcontribution statement; retrieving at least one rule based at least inpart on said at least one analog test harness model associated with theelectronic circuit and said at least one verification subroutinecommand; translating, at the processor, said at least one verificationsubroutine command into corresponding to at least one of standardizedanalog hardware description language based at least in part upon said atleast one verification subroutine command, said retrieved at least onerule, said at least one analog test harness model associated with theelectronic circuit, said at least one of at least one measurementparameter stored in the at least one specification database associatedwith the electronic design file, said at least two stimulus parametersstored in the at least one specification database associated with theelectronic design file and said at least one specification parameterstored in the at least one specification database associated with theelectronic design file, and having at least one of said parameterstreated as the parameterized variable; generating, at the processor, anetlist for said electronic circuit based at least in part upon saidtranslation of said at least one verification subroutine command;electrically simulating at least one subcomponent of the electroniccircuit utilizing at least in part said at least one analog test harnessmodel associated with the electronic circuit; extracting at least oneperformance attribute of said electronic design file undergoing saidelectrical simulation; and comparing, at the processor, said extractedat least one performance attribute and at least one output measurementto at least one specification parameter stored in at least onespecification database associated with the electronic design file. 32.The computer program product implemented method of translation ofverification commands of said electronic design file of claim 31,further comprising the step of fixing said parameterized variable. 33.The computer program product implemented method of translation ofverification commands of said electronic design file of claim 31,further comprising the step of varying said parameterized variable in atleast one separate simulation run.
 34. The computer program productimplemented method of translation of verification commands of saidelectronic design file of claim 31, further comprising the step ofvarying said parameterized variable within at least one simulation run.35. The computer program product implemented method of translation ofverification commands of said electronic design file of claim 31 whereinsaid at least one performance attribute is extracted during saidsimulation.
 36. The computer program product implemented method oftranslation of verification commands of said electronic design file ofclaim 31 wherein said at least one performance attribute is extractedafter said simulation.
 37. The computer program product implementedmethod of translation of verification commands of said electronic designfile of claim 31, wherein a second stimulus parameter of the at leasttwo stimulus parameters comprises a stimulus applied to the electroniccircuit but not to a pin of the electronic circuit.
 38. The computerprogram product implemented method of translation of verificationcommands of said electronic design file of claim 37, wherein the secondstimulus parameter of the at least two stimulus parameters comprises astimulus from a group of stimulus consisting of voltage, current andtemperature.
 39. The computer program product implemented method oftranslation of verification commands of said electronic design file ofclaim 31 wherein said at least one analog test harness model associatedwith the electronic circuit having at least one of at least one outputassertion and at least one output measurement with said at least one ofat least one specification parameter stored in the at least onespecification database associated with the electronic design file, saidat least one measurement parameter stored in the at least onespecification database associated with the electronic design file andsaid at least two stimulus parameters stored in the at least onespecification database associated with the electronic design file.
 40. Acomputer program product embodied on a non-transitory computer usablemedium, said non-transitory computer usable medium having stored thereona sequence of instructions which, when executed by a processor causessaid processor to execute a method of translation of verificationcommands of an electronic design file of an electronic circuit definedby the electronic design file, said method comprising the steps of:receiving, at the processor, at least one analog test harness modelhaving at least one of at least one output assertion and at least oneoutput measurement, wherein said at least one analog test harness modelassociated with the electronic circuit having at least one of at leastone measurement parameter stored in at least one specification databaseassociated with the electronic design file, at least two stimulusparameters stored in the at least one specification database associatedwith the electronic design file and at least one specification parameterstored in the at least one specification database associated with theelectronic design file, a first stimulus parameter of the at least twostimulus parameters comprising an input to an input pin of theelectronic circuit defined by the electronic design file, and having atleast one of said parameters treated as a parameterized variable,wherein said at least one analog test harness model associated with theelectronic circuit validates said at least one specification subsetbased at least in part upon said at least one of at least one outputassertion and at least one output measurement; receiving, at theprocessor, at least one verification subroutine command for saidelectronic design file, said at least one verification subroutinecommand having at least one indirect branch contribution statement;retrieving, at the processor, at least one rule based at least in parton said at least one analog test harness model associated with theelectronic circuit and said at least one verification subroutinecommand; translating, at the processor, said at least one verificationsubroutine command into corresponding to at least one of standardizedanalog hardware description language based at least in part upon said atleast one verification subroutine command, said retrieved at least onerule, said at least one analog test harness model associated with theelectronic circuit, said at least one specification parameter or atleast one measurement parameter stored in at least one specificationdatabase associated with the electronic design file; generating, at theprocessor, a netlist for said electronic circuit based at least in partupon said translation of said at least one verification subroutinecommand; electrically simulating at least one subcomponent of theelectronic circuit utilizing at least in part said at least one analogtest harness model associated with the electronic circuit; extracting atleast one performance attribute of said electronic design fileundergoing said electrical simulation; and comparing, at the processor,said extracted at least one performance attribute and said at least oneof at least one output assertion and at least one output measurement toat least one specification in at least one specification databaseassociated with the electronic design file.
 41. The computer programproduct implemented method of translation of verification commands ofsaid electronic design file of claim 40, wherein said at least one ofstandardized analog hardware description language comprises at least oneof Verilog-A™ and Verilog-AMS.
 42. The computer program productimplemented method of translation of verification commands of saidelectronic design file of claim 40, further comprising the step ofmodifying said at least one analog test harness model associated withthe electronic circuit based at least in part upon a designated outcome.43. The computer program product implemented method of translation ofverification commands of said electronic design file of claim 40,further comprising the step of modifying said at least one verificationsubroutine command based at least in part upon a designated outcome. 44.The computer program product implemented method of translation ofverification commands of said electronic design file of claim 40 furthercomprising the step of modifying said parameterized variable.
 45. Thecomputer program product implemented method of translation ofverification commands of said electronic design file of claim 40,wherein said electronic design file resulting in at least one of atleast one active circuit and at least one passive circuit.
 46. Thecomputer program product implemented method of translation ofverification commands of said electronic design file of claim 40,wherein said electronic design file resulting in at least one activecircuit that adjusts at least one of at least one gain and at least onedirection of at least one electrical signal.
 47. The computer programproduct implemented method of translation of verification commands ofsaid electronic design file of claim 40, wherein said at least oneverification subroutine command having at least one specificationsubset.
 48. The computer program product implemented method oftranslation of verification commands of said electronic design file ofclaim 40, wherein said at least one verification subroutine commandhaving at least one specification subset and having at least one of saidat least one measurement parameter stored in the at least onespecification database associated with the electronic design file, saidat least two stimulus parameters stored in the at least onespecification database associated with the electronic design file andsaid at least one specification parameter stored in the at least onespecification database associated with the electronic design file. 49.The computer program product implemented method of translation ofverification commands of said electronic design file of claim 40,wherein a second stimulus parameter of the at least two stimulusparameters comprises a stimulus applied to the electronic circuit butnot to a pin of the electronic circuit.
 50. The computer program productimplemented method of translation of verification commands of saidelectronic design file of claim 49, wherein the second stimulusparameter of the at least two stimulus parameters comprises a stimulusfrom a group of stimulus consisting of voltage, current and temperature.51. The computer program product implemented method of translation ofverification commands of said electronic design file of claim 40,wherein said at least one analog test harness model associated with theelectronic circuit validates said at least one specification subsetbased at least in part upon said at least one of at least one outputassertion and at least one output measurement with at least one of saidat least one measurement parameter stored in the at least onespecification database associated with the electronic design file, saidat least two stimulus parameters stored in the at least onespecification database associated with the electronic design file andsaid at least one specification parameter stored in the at least onespecification database associated with the electronic design file.